| Probe Type |
Semiconductor / High Density |
| Probe Technology |
Passive |
| Probe Configuration |
Spring Loaded |
| Approvals |
RoHS Compliant |
| Notes |
Crown point probe designed for loaded PCB testing |
| Abstract |
Decreased stroke, full stroke = .250 [6.35]. 6 170 ms) D a Must select spring from X75-25 Series (L, S, H, Y, or X ) with this option.
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