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125-25 Series -- 125-PRG2556 Test Probes, Electrical Data Sheets QA Technology Company, Inc.

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125-25 Series -- 125-PRG2556

SPECIFICATIONS

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Probe Type	Semiconductor / High Density
Probe Technology	Passive
Probe Configuration	Spring Loaded
Operating Temperature (C)	4 to 204
Approvals	RoHS Compliant
Notes	Crown point probe designed for loaded PCB testing
Abstract	The 125-25 series probes are designed for loaded board testing. Probe 01 - Spear 10 - Flat 03 - Chisel 22 - Cup 09 - Serrated 24 - Crown

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Double Ended Socket -- 050-SBB16*DS0

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