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100-25 Series -- 100-PRH2507 Test Probes, Electrical Data Sheets QA Technology Company, Inc.


Available from: QA Technology Company, Inc.
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100-25 Series -- 100-PRH2507
SPECIFICATIONS View Entire Datasheet
Probe Type Semiconductor / High Density
Probe Technology Passive
Probe Configuration Spring Loaded
Operating Temperature (C) 4 to 121
Approvals RoHS Compliant
Notes Tulip point probe designed for loaded PCB testing
Abstract The 100-25 series probes and sockets are designed for loaded board testing. 08 or 08 - Triad 22 - Cup Probe 01 - Spear 09 or 09 - Serrated 24 or 24 - Crown 03 or 03 - Chisel 10 - Flat 29 - Serrated 04 - Crown 14 - Crown 30 - Spherical 05 - Torch 17 or 17 - Tulip 31 - Spear 06 - Star 18 or 18 - Chisel Triad 32 - Cup
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